OEPV paper featured on the cover of Advanced materials

Featured article on the cover of Advanced Materials

11/19/2012
The Communication titled Direct Structural Mapping of Organic Field-Effect Transistors Reveals Bottlenecks to Carrier Transport​" by Dr. Ruipeng Li, research scientist, in the Organic Electronics and Photovoltaics group, has been featured on the front cover of the Advanced Materials Issue 41,  Vol 24.  
The paper demonstrates an X-ray microbeam technique capable of mapping the microstructural variations of the organic semiconductor within the channel of real devices; the insight is used to identify and then to reduce bottlenecks to charge transport. The work led by Dr. Aram Amassian was conducted at KAUST and at the Cornell High Energy Synctrotron Source (CHESS), in collaboration with the Jurchescu group at Wake Forest University, with Dr. Smilgies at CHESS, and the Anthony group at University of Kentucky. 


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[Ruipeng Li, Jeremy W. Ward, Detlef-M. Smilgies, Marcia M. Payne, John E. Anthony, Oana D. Jurchescu, Aram Amassian Direct Structural Mapping of Organic Field-Effect Transistors Reveals Bottlenecks to Carrier Transport. Adv. Mater., 24: 5553–5558. doi: 10.1002/adma.201201856]

Links:
Cornell Chroncil online