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Total result(s) found: 4
  • A. Amassian, P. Desjardins, L. Martinu, “Ion-surface interactions on c-Si(001) at the radiofrequency-powered electrode in low-pressure plasmas: Ex situ spectroscopic ellipsometry and Monte Carlo simulation study” J. Vac. Sci. Technol. A24 (2005) 45. (Also featured in the December 2005 issue of the Virtual Journal of Nanoscale Science and Technology).
Keywords:
silicon, silicon compounds, elemental semiconductors, electrodes, ion-surface impact, ellipsometry, Monte Carlo methods, oxidation, plasma CVD, sputter deposition, crystal defects, ballistic transport, high-frequency discharges, Si, SiO2, O2
  • K. Kaminska, A. Amassian, L. Martinu, K. Robbie, “Growth of vacuum evaporated ultra-porous silicon studied with spectroscopic ellipsometry and scanning electron microscopy” J. Appl. Phys. 97 (2005) 13511.
Keywords:
silicon, elemental semiconductors, semiconductor thin films, porous semiconductors, nanoporous materials, vacuum deposition, refractive index, porosity, ellipsometry, scanning electron microscopy
  • M. Gaidi, L. Stafford, A. Amassian, M. Chaker, J. Margot, L. Martinu, V. Kulishov, “Influence of the microstructure on the optical properties of SrTiO3 thin films” J. Mat. Res. 20 (2005) 68.
Keywords:
NA
  • M. Tabbal, T. Christidis, S. Isber, P. Mérel, M. A. El Khakani, M. Chaker, A. Amassian, L. Martinu, “Correlation between the SP2-phase nanostructure and the physical properties of unhydrogenated carbon nitride” J. Appl. Phys. 98 (2005) 044310.
Keywords:
carbon compounds, nanostructured materials, thin films, pulsed laser deposition, Raman spectra, EPR line breadth, amorphous state, indentation, optical constants, hardness